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Joint Electronics Type Designation System TS1100U Part with NSN 6625005804166 - Quote Now

Part No. : TS1100U
CAGE Code : 80058
NIIN : 00-580-4166
Item Name : test set semiconduc
INC Code : 25006
NCB Code : 00
Country : USA
NA

Thank you for having an interest in our selection of Joint Electronics Type Designation System products here on ASAP AOG. You have reached the Request for Quote (RFQ) page for part number TS1100U, where you can submit details on your needs to receive tailored pricing and procurement options from our staff. Before you get started, be sure to review the information below to confirm the details of this part number TS1100U. If you have any questions, we are always available by phone or email.

Part Number TS1100U Details:
 
Part number TS1100U traces back to Joint Electronics Type Designation System through the CAGE Code (CAGE Code 80058), commonly listed with the item name Test Set Semiconduc. Classified with the NSN 6625005804166, this part number has the NIIN 005804166, the INC 25006, and NCB code 00 (USA). For further details, this component belongs to the Federal Supply Group (FSG) 66 Instruments and Laboratory Equipment and Federal Supply Class (FSC) 6625 Electrical And Electronic Properties Measuring And Testing Instruments.


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This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-conditions.aspx. All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without CAGE code 6RE77 is void.

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Characteristics Data of NSN 6625-00-580-4166, 6625005804166

MRCCriteriaCharacteristic
FEATSPECIAL FEATURESTRANSISTOR UNDER TEST DOES NOT HAVE TO BE REMOVED FROM CIRCUIT FOR TEST
RDALIII REFERENCE DATA AND LITERATURET.O. 33A1-3-149-1
FCLSIII FUNCTIONAL CLASSIFICATIONA-9.3
AKWBJOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBERTS/1100A/U
ANNQMATERIAL AND LOCATIONPLASTIC, PHENOLIC CARRYING CASE
HGTHHEIGHT9.200 INCHES NOMINAL
ANPZINCLOSURE FEATURESINGLE ITEM W/HOUSING
ABRYLENGTH7.700 INCHES NOMINAL
AQXYTEST TYPE FOR WHICH DESIGNEDMEASURE BETA OF TRANSISTOR
AKWAJOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAMETEST SET,TRANSISTOR
AQXZOPERATING TEST CAPABILITYBETA UP TO 300 IN 4 RANGES AND ICO UP TO 500 MICROAMPS IN 2 RANGES
ALSFINTERNAL BATTERY ACCOMMODATIONINCLUDED
AKWCELECTRICAL POWER SOURCE RELATIONSHIPOPERATING
ABGLWIDTH6.600 INCHES NOMINAL

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