MRC | Criteria | Characteristic |
---|
AAQL | BODY STYLE | W/O MTG FACILITIES, TERMINAL(S) ON ONE SURFACE" |
AARG | RELIABILITY INDICATOR | NOT ESTABLISHED" |
ADAQ | BODY LENGTH | 1.275 INCHES NOMINAL" |
ADAT | BODY WIDTH | 0.690 INCHES NOMINAL" |
ADAU | BODY HEIGHT | 1.062 INCHES NOMINAL" |
AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S)" |
AECE | ANODE TYPE | SOLID" |
AECN | IMPEDANCE AT MINIMUM OPERATING TEMP IN OHMS | 3.1" |
AECQ | ELECTRICAL POLARIZATION | POLARIZED" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE" |
CQBQ | CAPACITANCE VALUE PER SECTION | 960.000 MICROFARADS SINGLE SECTION" |
CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM" |
CQLH | DC LEAKAGE AT MAXIMUM OPERATING TEMP | 58.0 MILLIAMPERES" |
CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 15.0 DC SINGLE SECTION" |
CRTP | TOLERANCE RANGE PER SECTION | -20.00/+20.00 PERCENT SINGLE SECTION" |
CWJK | CASE MATERIAL | METAL" |
CWNJ | CAPACITIVE ELECTRODE MATERIAL | TANTALUM" |
CWPN | POWER FACTOR AT REFERENCE TEMP IN PERCENT | 15.0000" |
CWQH | DC LEAKAGE AT REFERENCE TEMP | 7.000 MICROAMPERES" |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
TEST | TEST DATA DOCUMENT | 81349-MIL-C-3965 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTIN" |
TTQY | TERMINAL TYPE AND QUANTITY | 2 TAB, SOLDER LUG" |
AAQL | BODY STYLE | W/O MTG FACILITIES, TERMINAL(S) ON ONE SURFACE" |
AARG | RELIABILITY INDICATOR | NOT ESTABLISHED" |
ADAQ | BODY LENGTH | 1.275 INCHES NOMINAL" |
ADAT | BODY WIDTH | 0.690 INCHES NOMINAL" |
ADAU | BODY HEIGHT | 1.062 INCHES NOMINAL" |
AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S)" |
AECE | ANODE TYPE | SOLID" |
AECN | IMPEDANCE AT MINIMUM OPERATING TEMP IN OHMS | 3.1" |
AECQ | ELECTRICAL POLARIZATION | POLARIZED" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE" |
CQBQ | CAPACITANCE VALUE PER SECTION | 960.000 MICROFARADS SINGLE SECTION" |
CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM" |
CQLH | DC LEAKAGE AT MAXIMUM OPERATING TEMP | 58.0 MILLIAMPERES" |
CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 15.0 DC SINGLE SECTION" |
CRTP | TOLERANCE RANGE PER SECTION | -20.00/+20.00 PERCENT SINGLE SECTION" |
CWJK | CASE MATERIAL | METAL" |
CWNJ | CAPACITIVE ELECTRODE MATERIAL | TANTALUM" |
CWPN | POWER FACTOR AT REFERENCE TEMP IN PERCENT | 15.0000" |
CWQH | DC LEAKAGE AT REFERENCE TEMP | 7.000 MICROAMPERES" |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
TEST | TEST DATA DOCUMENT | 81349-MIL-C-3965 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTIN" |
TTQY | TERMINAL TYPE AND QUANTITY | 2 TAB, SOLDER LUG" |