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Curtiss Wright Controls Inc ST2954 Part with NSN 6625007248444 - Quote Now

Part No. : ST2954
CAGE Code : 71791
NIIN : 00-724-8444
Item Name : test set semiconduc
INC Code : 25006
NCB Code : 00
Country : USA
NA

Thank you for having an interest in our selection of Curtiss Wright Controls Inc products here on ASAP AOG. You have reached the Request for Quote (RFQ) page for part number ST2954, where you can submit details on your needs to receive tailored pricing and procurement options from our staff. Before you get started, be sure to review the information below to confirm the details of this part number ST2954. If you have any questions, we are always available by phone or email.

Part Number ST2954 Details:
 
Part number ST2954 traces back to Curtiss Wright Controls Inc through the CAGE Code (CAGE Code 71791), commonly listed with the item name Test Set Semiconduc. Classified with the NSN 6625007248444, this part number has the NIIN 007248444, the INC 25006, and NCB code 00 (USA). For further details, this component belongs to the Federal Supply Group (FSG) 66 Instruments and Laboratory Equipment and Federal Supply Class (FSC) 6625 Electrical And Electronic Properties Measuring And Testing Instruments.


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This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-conditions.aspx. All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without CAGE code 6RE77 is void.

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Characteristics Data of NSN 6625-00-724-8444, 6625007248444

MRCCriteriaCharacteristic
FCLSIII FUNCTIONAL CLASSIFICATIONAA-9.3
ANPZINCLOSURE FEATURESINGLE ITEM W/HOUSING
AQXYTEST TYPE FOR WHICH DESIGNEDMEASUREMENT OF TRANSISTORS

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