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Advanced Testing Technologies B504OPTION500 Part with NSN 6625014761772 - Quote Now

Part No. : B504OPTION500
CAGE Code : 0DRX9
NIIN : 01-476-1772
Item Name : test program set
INC Code : 37828
NCB Code : 01
Country : USA
NA

Thank you for having an interest in our selection of Advanced Testing Technologies products here on ASAP AOG. You have reached the Request for Quote (RFQ) page for part number B504OPTION500, where you can submit details on your needs to receive tailored pricing and procurement options from our staff. Before you get started, be sure to review the information below to confirm the details of this part number B504OPTION500. If you have any questions, we are always available by phone or email.

Part Number B504OPTION500 Details:
 
Part number B504OPTION500 traces back to Advanced Testing Technologies through the CAGE Code (CAGE Code 0DRX9), commonly listed with the item name Test Program Set. Classified with the NSN 6625014761772, this part number has the NIIN 014761772, the INC 37828, and NCB code 01 (USA). For further details, this component belongs to the Federal Supply Group (FSG) 66 Instruments and Laboratory Equipment and Federal Supply Class (FSC) 6625 Electrical And Electronic Properties Measuring And Testing Instruments.


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This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-conditions.aspx. All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without CAGE code 6RE77 is void.

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Characteristics Data of NSN 6625-01-476-1772, 6625014761772

MRCCriteriaCharacteristic
MRCDecoded RequirementClear Text Reply
CXCYPart Name Assigned By Controlling AgencyOPTION 504 HIGH DIGITAL TEST SYSTEM
FEATSpecial FeaturesSAME AS THE BRAT B504 50 MHZ HIGHSPEED DIGITAL TEST SYSTEM; CAN BE USEDIN A VARIETY OF BRAT TEST STATION; RECONFIGURABLE WITH ROOM FOR EXPANSION; THE INTERFACE, 320/640 HIGH SPEED DIGITAL INPUT/OUTPUT PINS; HAS ANALOG TEST POINTS; MULTIPLE PROGRAMMABLE AC AND DC POWER SYSTEMS ARE RECONFIGURABLE PRECISION POWER SUBSYSTEMS; HIGH SPEED DYNAMIC DIGITAL; SEVEN DISTINCT I/O MEMORY TYPES DATA FORMATTING W/ PRECIES EDGE PLACEMENT; INTENED FOR USE IN AN AUTOMATIC TESTING ENVIRONMENT THAT REQUIRES HIGH SPEED DIGITAL STIMULUS AND RESPONSE CAPABILITIES FOR SERIAL AND PARALLEL TESTING; THIS BRAT SYSTEM IS IN AN MS-WINDOWS ENVIRONMENT; OPTION 500 ADDS INCREASED PIN COUNT FROM 640 TO 800+ TO ACCOMMODATE THE AMP (728I/O) AND THE VIM (637 I/O)
AJKEEnd Item Source0DRX9
AGAVEnd Item IdentificationUSED WITH BRAT TEST STATIONS
AFJSPortability MethodBRAKE TYPE CASTERS

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