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Accelonix 99-0076 Part with NSN 6625012873379 - Quote Now

Part No. : 99-0076
Alternate P/N: 990076
Manufacturer : accelonix
CAGE Code : F8791
NIIN : 01-287-3379
Item Name : test set electronic
INC Code : 77777
NCB Code : 01
Country : USA
NA

Thank you for having an interest in our selection of Accelonix products here on ASAP AOG. You have reached the Request for Quote (RFQ) page for part number 99-0076, where you can submit details on your needs to receive tailored pricing and procurement options from our staff. Before you get started, be sure to review the information below to confirm the details of this part number 99-0076. If you have any questions, we are always available by phone or email.

Part Number 99-0076 Details:
 
Part number 99-0076 traces back to Accelonix through the CAGE Code (CAGE Code F8791), commonly listed with the item name Test Set Electronic. Classified with the NSN 6625012873379, this part number has the NIIN 012873379, the INC 77777, and NCB code 01 (USA). For further details, this component belongs to the Federal Supply Group (FSG) 66 Instruments and Laboratory Equipment and Federal Supply Class (FSC) 6625 Electrical And Electronic Properties Measuring And Testing Instruments.


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This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-conditions.aspx. All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without CAGE code 6RE77 is void.

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Characteristics Data of NSN 6625-01-287-3379, 6625012873379

MRCCriteriaCharacteristic
TEXTGENERAL CHARACTERISTICS ITEM DESCRIPTIONFOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT
ZZZWDEPARTURE FROM CITED DOCUMENTPEACETIME DEMAND OBTAIN
CXCYIII PART NAME ASSIGNED BY CONTROLLING AGENCYTEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER

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