NSN 5962-01-111-7850 (5962011117850) Microcircuit Digital Parts Catalog

The part belongs to NSN 5962-01-111-7850 is an Microcircuit Digital produced by Texas Instruments Inc Control Pr, Texas Instruments Inc Metallurgi, Fairchild Semiconductor Corp, Miscellaneous, Raytheon Co. This specific NSN is a numeric identifier assigned by the Defense Logistics Agency (DLA) to categorize all products distributed by the NATO federal supply chain. At ASAP AOG, a company owned and operated by ASAP Semiconductor, we possess parts that belong to the NSN 5962-01-111-7850 and these are readily available in our current inventory. Our on-hand inventory contains parts belonging to this particular NSN that you can easily access. So, if you need an Microcircuit Digital made by Texas Instruments Inc Control Pr, Texas Instruments Inc Metallurgi, Fairchild Semiconductor Corp, Miscellaneous, Raytheon Co that carries the NSN 5962-01-111-7850, you can rely on us to provide you with the necessary parts from our available inventory.

At ASAP AOG, we are dedicated to providing competitive quotes for premium NATO parts. We work hard to ensure all the national stock number 5962011117850 parts are fully certified and up to standard. Our supply chain is extensive and one of the fastest in the industry. Have a question or need a quote today? Simply fill out the RFQ below.

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM"
ADAT	BODY WIDTH	0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM"
ADAU	BODY HEIGHT	0.180 INCHES MAXIMUM"
AEHX	MAXIMUM POWER DISSIPATION RATING	90.0 MILLIWATTS"
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS"
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS"
CBBL	FEATURES PROVIDED	HIGH SPEED AND MONOLITHIC AND HERMETICALLY SEALED"
CQSJ	INCLOSURE MATERIAL	CERAMIC"
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE"
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC"
CQZP	INPUT CIRCUIT PATTERN	QUAD 2 INPUT"
CSSL	DESIGN FUNCTION AND QUANTITY	4 GATE, NAND"
CWSG	TERMINAL SURFACE TREATMENT	SOLDER"
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE"
CZEQ	TIME RATING PER CHACTERISTIC	10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT"
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)."
TTQY	TERMINAL TYPE AND QUANTITY	14 PRINTED CIRCUIT"
ADAQ	BODY LENGTH	0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM"
ADAT	BODY WIDTH	0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM"
ADAU	BODY HEIGHT	0.180 INCHES MAXIMUM"
AEHX	MAXIMUM POWER DISSIPATION RATING	90.0 MILLIWATTS"
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS"
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS"
CBBL	FEATURES PROVIDED	HIGH SPEED AND MONOLITHIC AND HERMETICALLY SEALED"
CQSJ	INCLOSURE MATERIAL	CERAMIC"
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE"
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC"
CQZP	INPUT CIRCUIT PATTERN	QUAD 2 INPUT"
CSSL	DESIGN FUNCTION AND QUANTITY	4 GATE, NAND"
CWSG	TERMINAL SURFACE TREATMENT	SOLDER"
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE"
CZEQ	TIME RATING PER CHACTERISTIC	10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT"
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)."
TTQY	TERMINAL TYPE AND QUANTITY	14 PRINTED CIRCUIT"

MRC

Criteria

Characteristic

ADAQ

BODY LENGTH

0.755 INCHES MINIMUM AND 0.785 INCHES MAXIMUM"

ADAT

BODY WIDTH

0.245 INCHES MINIMUM AND 0.280 INCHES MAXIMUM"

ADAU

BODY HEIGHT

0.180 INCHES MAXIMUM"

AEHX

MAXIMUM POWER DISSIPATION RATING

90.0 MILLIWATTS"

AFGA

OPERATING TEMP RANGE

-55.0/+125.0 DEG CELSIUS"

AFJQ

STORAGE TEMP RANGE

-65.0/+150.0 DEG CELSIUS"

CBBL

FEATURES PROVIDED

HIGH SPEED AND MONOLITHIC AND HERMETICALLY SEALED"

CQSJ

INCLOSURE MATERIAL

CERAMIC"

CQSZ

INCLOSURE CONFIGURATION

DUAL-IN-LINE"

CQWX

OUTPUT LOGIC FORM

TRANSISTOR-TRANSISTOR LOGIC"

CQZP

INPUT CIRCUIT PATTERN

QUAD 2 INPUT"

CSSL

DESIGN FUNCTION AND QUANTITY

4 GATE, NAND"

CWSG

TERMINAL SURFACE TREATMENT

SOLDER"

CZEN

VOLTAGE RATING AND TYPE PER CHARACTERISTIC

7.0 VOLTS MAXIMUM POWER SOURCE"

CZEQ

TIME RATING PER CHACTERISTIC

10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT"

TEST

TEST DATA DOCUMENT

96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)."

TTQY

TERMINAL TYPE AND QUANTITY

14 PRINTED CIRCUIT"